A 1550-nm-wavelength Compatible Photoconductive Microprobe Transceiver For Terahertz Near-field Reflection Measurements

Paper (OPTO6)

Fri, 13 Nov 2020 12:45am to 01:00am

Room: Tesla

Attend in Zoom

THz-radiation based measurements in reflectionmode
provide several advantages over transmission-mode
configurations such as depth information and single side sample
access that can be used e.g. for the inspection of multi-layer
structures, detection of buried defects or the investigation of
samples on THz opaque substrates. We present here an
InGaAs:RH-based photo-conductive transceiver probe operating
at 1550 nm excitation and sampling wavelength which can be
directly driven by modern fiber-based THz TDS systems without
requiring optical frequency-doubling units. The new probe will
foster the configuration of fiber-based robotic scanning systems
thanks to the simplification of the optical front-end module.

Presenters and Authors Info

Presenter: Anonymous

Authors: Michalski, Alexander; Sawallich, Simon; Nagel, Michael

Protemics GmbH