Development Of Passive Near-field Spectroscopy For Thermal Evanescent Wave

Paper (MM11)

Tue, 10 Nov 2020 06:00pm to 06:15pm

Room: Canalside

Attend in Zoom

The local dynamics on materials generate thermal evanescent waves that are strongly localized on material surfaces. Sensing the thermal evanescent waves with scattering-type scanning near-field optical microscopy (s-SNOM) without any external light sources enables imaging of the local dynamics at the nanoscale. Here, we report passive THz scanning near-field optical spectroscopy (SNOS), in which a wavelength selective mechanism was constructed on s-SNOM. We have achieved detecting far-field spectrum at wavelengths of 8.0 -15.5 m and broadband near-field signals of an Au/SiC sample at room temperature. The spectrum of the thermal evanescent wave enables a detailed analysis of the material.

Download Abstract: pid6587713.pdf

Presenters and Authors Info

Presenter: Anonymous

Authors: Sakuma, Ryoko; Lin, Kuan-Ting; Kim, Sunmi; Kimura, Fuminobu; Kajihara, Yusuke

Institute of Industrial Science, The University of Tokyo, National Institute of Information and Communications Technology, The University of Tokyo