A Novel Scattering-type SNOM-tip Featuring An Integrated Bias-free Optically Driven Terahertz Pulse EmitterPaper (MM12)
Wed, 11 Nov 2020 06:30pm to 06:45pm
In this work we present a new approach to enhance the measurement speed and signal-to-noise ratio of scattering-type scanning near-field optical microscopy (s-SNOM) systems aiming for time-domain operation at terahertz frequencies. It is based on a standard atomic-force-microscope (AFM) tip that is supplemented with an integrated THz source. This device is offering an efficient solution to reduce coupling losses between THz pulse emitter and the scattering tip — one of the main performance limiting factors in current state-of-the-art systems.
Download Abstract: pid6419747.pdf
Authors: Nagel, Michael; Sawallich, Simon; Michalski, Alexander; Schäffer, Stephan; Wigger, Anna; Haring Bolivar, Peter
Protemics GmbH, University of Siegen