Reference Free Material Parameter Extraction Of Small Objects Based On Terahertz EllipsometryPoster (INDASTR-P1)
Tue, 10 Nov 2020 01:15am to 03:00am
In this paper, we introduce a promising multistage procedure for the material parameter extraction of small objects in reflection-mode. The capability of this technique is demonstrated by the characterization of a ceramic post with an edge length of 3.4 mm.
Authors: Friederich, Benedikt; Damyanov, Dilyan; Schultze, Thorsten; Balzer, Jan C.