Reference Free Material Parameter Extraction Of Small Objects Based On Terahertz Ellipsometry

Poster (INDASTR-P1)

Tue, 10 Nov 2020 01:15am to 03:00am

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In this paper, we introduce a promising multistage procedure for the material parameter extraction of small objects in reflection-mode. The capability of this technique is demonstrated by the characterization of a ceramic post with an edge length of 3.4 mm.

Presenters and Authors Info

Presenter: Anonymous

Authors: Friederich, Benedikt; Damyanov, Dilyan; Schultze, Thorsten; Balzer, Jan C.

University Duisburg-Essen