Terahertz Characterization Of Roman Amphora Sherds
Paper (MM4)Thu, 12 Nov 2020 03:30pm to 03:45pm
Room: Canalside
We present nondestructive, noncontact measurements of skin thickness w in Roman amphora sherds by means of THz TOF tomography for the first time providing quantitative stratigraphic characterization. We find w to be ~ 50 microns with a 5 microns standard deviation across the regions of the two sherds.
Presenter: Anonymous
Authors: zhai, min; Locquet, Alexandre; Citrin, David
Georgia tech Lorraine