Wafer-scale Inspection Of Graphene Conductivity By THz Near-fieldscanning: As-grown On Sapphire And After Transfer To SiO2/Si
Poster (MATL-P5)Fri, 13 Nov 2020 01:15am to 03:00am
Room: Exhibit/Poster Hall
Event Picture:
We present THz near-field transmission measurements
for CVD-grown 2” graphene mono-layer on sapphire before and
after transfer to SiO2/Si substrate. The capability to detect changes
in the graphene electronic properties after the transfer reveal the
potential of THz-measurements as a non-destructive inspection
tool for large scale samples with micron-scale resolution.
Presenter: Anonymous
Authors: Michalski, Alexander; Sawallich, Simon; Krotkus, Simonas; Pandey, Himadri; Satender, Kataria; Heuken, Michael; Nagel, Michael; Lemme, Max
AIXTRON SE, AMO GmbH, ELD - RWTH Aachen University, Protemics GmbH